Influence of hydrogen on electrical and optical properties of ZnO films
- Authors
- Kim, Y. H.; Karazhanov, S. Zh.; Kim, W. M.
- Issue Date
- 2011-07
- Publisher
- WILEY-V C H VERLAG GMBH
- Citation
- PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.248, no.7, pp.1702 - 1707
- Abstract
- Electrical and optical properties of H doped ZnO films have been studied experimentally for different H concentrations before and after annealing, as well as theoretically by first-principles calculations. It is found that electrical resistivity of the H doped ZnO increases when increasing the substrate temperature in the range 25-300 degrees C. Carrier concentration and mobility measured by Hall method in as-grown samples are larger than those of annealed ones. The short-wavelength edge of the transmission spectrum of annealed ZnO is found to shift toward lower energies compared to as-grown samples. The band gap estimated from the measured transmission spectra of as grown ZnO increases with increasing H concentration, thus demonstrating the Burstein-Moss effect. However, it decreases in samples annealed at 300 degrees C showing suppression of the Burstein-Moss effect. Possible defect models explaining the reason for the suppression are discussed. The results can be explained by formation of H-2 molecules in annealed ZnO. (C) 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
- Keywords
- OXIDE; OXIDE; Burstein-Moss effect; doping; hydrogen; ZnO
- ISSN
- 0370-1972
- URI
- https://pubs.kist.re.kr/handle/201004/130197
- DOI
- 10.1002/pssb.201046426
- Appears in Collections:
- KIST Article > 2011
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