Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lim, Jun | - |
dc.contributor.author | Shin, Hyun-Joon | - |
dc.contributor.author | Chae, Keun Hwa | - |
dc.contributor.author | Hwang, Chan-Cuk | - |
dc.contributor.author | Hwang, Han-Na | - |
dc.contributor.author | Hong, Chung Ki | - |
dc.date.accessioned | 2024-01-20T19:04:14Z | - |
dc.date.available | 2024-01-20T19:04:14Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2010-06 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/131398 | - |
dc.description.abstract | A full-field transmission soft x-ray microscope (TXM) was developed at the Pohang Light Source. With a 2 mm diameter condenser zone plate and a 40 nm outermost-zone-width objective zone plate, the TXM's achieved spatial resolution is better than 50 nm at the photon energy of 500 eV (wavelength: 2.49 nm). The TXM is portable and mounted in tandem with a 7B1 spectroscopy end station. The sample position is outside the vacuum, allowing for quick sample changes and enhanced in situ experimental capability. In addition, the TXM is pinhole-free and easy to align, having commercial mounts located outside the vacuum components. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3432000] | - |
dc.language | English | - |
dc.publisher | AMER INST PHYSICS | - |
dc.subject | RESOLUTION | - |
dc.subject | TOMOGRAPHY | - |
dc.title | A compact, sample-in-atmospheric-pressure soft x-ray microscope developed at Pohang Light Source | - |
dc.type | Article | - |
dc.identifier.doi | 10.1063/1.3432000 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | REVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.6 | - |
dc.citation.title | REVIEW OF SCIENTIFIC INSTRUMENTS | - |
dc.citation.volume | 81 | - |
dc.citation.number | 6 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000280102200023 | - |
dc.identifier.scopusid | 2-s2.0-77954210745 | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article | - |
dc.subject.keywordPlus | RESOLUTION | - |
dc.subject.keywordPlus | TOMOGRAPHY | - |
dc.subject.keywordAuthor | full-field transmission soft x-ray microscope | - |
dc.subject.keywordAuthor | Synchrotron radiation beamline | - |
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