Molecular dynamics simulation study of deposition and annealing behaviors of Al atoms on Cu surface

Authors
Kim, S. -P.Lee, K. -R.Chung, Y. -C.Sahashi, M.Kim, Y. K.
Issue Date
2009-06-01
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF APPLIED PHYSICS, v.105, no.11
Abstract
Deposition and annealing behaviors of Al atoms on rough Cu (111) surface were investigated on the atomic scale by three-dimensional classical molecular dynamics simulation. The rough Cu surface was modeled by depositing 5 ML of Cu on Ta (011) substrate. Most Al atoms deposited on the rough Cu surface placed on the atomic steps, preserving the major features of the surface during Al deposition. This behavior was discussed in terms of the smaller barrier of the surface diffusion than Ehrlich-Schwoebel barrier of Al on Cu (111) surface. By annealing at 700 K, significant intermixing between Al and Cu rapidly occurs with decrease in the surface roughness. This behavior reveals that the exchange process of Al with substrate Cu dominates during the initial stage of high temperature annealing. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3142382]
Keywords
CURRENT-CONFINED-PATH; THIN-FILM GROWTH; METALS; CURRENT-CONFINED-PATH; THIN-FILM GROWTH; METALS; MD simulation; interface; thin film
ISSN
0021-8979
URI
https://pubs.kist.re.kr/handle/201004/132404
DOI
10.1063/1.3142382
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KIST Article > 2009
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