Substrate Biasing Effect during MgO Deposition in CoFeB/MgO/CoFeB MTJs

Authors
Choi, G. M.Shin, K. H.Seo, S. A.Kim, S. O.Lim, W. C.Lee, T. D.
Issue Date
2009-06
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation
IEEE TRANSACTIONS ON MAGNETICS, v.45, no.6, pp.2371 - 2373
Abstract
High tunneling magnetoresistance (TMR) ratio and low RA in magnetic tunnel junctions are necessary condition for application in magnetic random access memory. To get high TMR ratio and low RA, good quality of MgO (002) insulating layer is important. To increase crystalline quality of MgO (002) layer, we applied negative bias on the substrate during MgO deposition. We report the results of the tunneling magnetoresistance (TMR) ratio and the resistance-area product (RA) for CoFeB/MgO/CoFeB magnetic tunnel junctions (MTJs) with substrate bias voltage, and showed TMR increase and RA decrease with substrate bias. The effects of substrate bias voltage on the TMR ratio, RA and MgO (002) peak intensity are discussed.
Keywords
MAGNETIC TUNNEL-JUNCTIONS; ROOM-TEMPERATURE; MAGNETORESISTANCE; DEPENDENCE; MAGNETIC TUNNEL-JUNCTIONS; ROOM-TEMPERATURE; MAGNETORESISTANCE; DEPENDENCE; Magnetic tunnel junctions (MTJs); resistance-area product (RA); substrate bias; tunneling magnetoresistance (TMR)
ISSN
0018-9464
URI
https://pubs.kist.re.kr/handle/201004/132440
DOI
10.1109/TMAG.2009.2018577
Appears in Collections:
KIST Article > 2009
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