Adhesion and interfacial characteristics of metal/PI composite film modified by O-2 ion beam
- Authors
- Lee, W. J.; Kim, Yoon B.
- Issue Date
- 2008-12-01
- Publisher
- ELSEVIER SCIENCE SA
- Citation
- THIN SOLID FILMS, v.517, no.3, pp.1191 - 1194
- Abstract
- In this study, the adhesion and interface characteristics of NiCr/Cu metal film oil PI film modified by O-2 ion beam were investigated. The surface modification of PI film by O-2 ion beam enabled a significant decrease of contact angles of water from 68 degrees to 4.4 degrees at an ion dose of 1 x 10(18) ions/cm(2), which resulted in an increase of surface energy by a factor of two, The XPS (X-ray Photoelectron Spectroscopy) spectrum showed that the functional groups of C-O and C=O bonding oil PI surface were increased by the interaction between scissored unstable chains and reactive ions. The peel strength between PI and NiCr/Cu metal film increased with all increase of ion dose and the highest peel strength of 0.70 N/mm was obtained at an ion dose of 1 x 10(18) ions/cm(2). According to the XPS depth profile from NiCr metal layer into modified PI film, the O1s peak was broadened at near-interface region with an increase of depth from NiCr layer, which indicates that the new chemical bonding state was formed. In addition to C-O and C=O bonding, the newly formed chemical bonding at the interface between NiCr metal film and PI film was identified as metal-oxide compounds such as NiO, Cr2O3, and Cr-O by XPS curve fitting. Consequently, the improvement of adhesion is primarily attributed to the strong chemical bonding caused by the chemical interaction between NiCr and newly formed functional group by O-2 ion beam. (C) 2008 Elsevier B.V. All rights reserved.
- Keywords
- SURFACE MODIFICATION; POLYMER; POLYETHYLENE; POLYIMIDE; SURFACE MODIFICATION; POLYMER; POLYETHYLENE; POLYIMIDE; PI film; Surface modification; Adhesion; Interface
- ISSN
- 0040-6090
- URI
- https://pubs.kist.re.kr/handle/201004/132893
- DOI
- 10.1016/j.tsf.2008.06.022
- Appears in Collections:
- KIST Article > 2008
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