Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Woochul | - |
dc.contributor.author | Kang, Hee Jae | - |
dc.contributor.author | Noh, Sam Kyu | - |
dc.contributor.author | Song, Jonghan | - |
dc.contributor.author | Kim, Chul Sung | - |
dc.date.accessioned | 2024-01-21T00:33:11Z | - |
dc.date.available | 2024-01-21T00:33:11Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 2007-09 | - |
dc.identifier.issn | 0304-8853 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/134159 | - |
dc.description.abstract | The magnetic and structural properties of Fe ion-implanted GaN was investigated by various measurements. XRD results did not show any peaks associated with second phase formation. The magnetization curve at 5K showed ferromagnetic behavior for 900 degrees C-annealed sample. In zero-field-cooled (ZFC) and field-cooled (FC) magnetization measurements, the irreversibility and a cusp-like behavior of the ZFC curve were observed for 900 degrees C-annealed sample. These behaviors are typically observed in superparamagnetic or spin glass phase. While the temperature dependence magnetization of 800 degrees C-annealed sample showed non-Brillouin-like curve and it is not exhibited ferromagnetic hysteresis at 5K. In XPS measurement, the coexistence of metallic Fe (Fe-0) and Fe-N bond (Fe2+ and Fe3+) for Fe 2p core level spectra is observed in as-implanted sample. But 700-900 degrees C-annealed samples showed only Fe-N bond (Fe2+ and Fe3+) spectra. For Ga 3d core level spectra only Ga-N bonds showed for as implanted with 700-900 degrees C-annealed samples. From XPS results, it could be explained that magnetic property of our films originated from FeN structures. (c) 2007 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.subject | THIN-FILMS | - |
dc.subject | SEMICONDUCTORS | - |
dc.subject | FERROMAGNETISM | - |
dc.subject | GROWTH | - |
dc.subject | CO | - |
dc.subject | CR | - |
dc.subject | GE | - |
dc.title | Magnetic and structural properties of Fe ion-implanted GaN | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.jmmm.2007.04.025 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.316, no.2, pp.E199 - E202 | - |
dc.citation.title | JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | - |
dc.citation.volume | 316 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | E199 | - |
dc.citation.endPage | E202 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | 000248150000152 | - |
dc.identifier.scopusid | 2-s2.0-34250332937 | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | THIN-FILMS | - |
dc.subject.keywordPlus | SEMICONDUCTORS | - |
dc.subject.keywordPlus | FERROMAGNETISM | - |
dc.subject.keywordPlus | GROWTH | - |
dc.subject.keywordPlus | CO | - |
dc.subject.keywordPlus | CR | - |
dc.subject.keywordPlus | GE | - |
dc.subject.keywordAuthor | ion implantation | - |
dc.subject.keywordAuthor | magnetic semiconductor | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.