Excess noise in vanadium tungsten oxide bolometric material

Authors
Chi-Anh, NguyenMoon, Sung
Issue Date
2007-03
Publisher
ELSEVIER
Citation
INFRARED PHYSICS & TECHNOLOGY, v.50, no.1, pp.38 - 41
Abstract
Vanadium tungsten oxide is a promising bolometric material for thermal sensing applications. Two samples with different vanadium tungsten oxide thickness were prepared for excess noise measurement. No sign of random telegraph signal noise was found. Results show low 1/f noise in the measurement frequency range from 10 Hz to 100 Hz. 1/f noise power spectral densities obey 1/f' frequency dependence, with gamma about to unity. The 1/f noise power spectrum at bias current of 5.4 mu A and frequency of 20 Hz is 4 x 10(-15) V-2/Hz. The result proves that new vanadium tungsten oxide is a strong candidate of thermometric materials for thermal imaging applications. (c) 2006 Elsevier B.V. All rights reserved.
Keywords
SILICON; SILICON; vanadium tungsten oxide; vanadium tungsten alloy; excess noise; low-frequency noise
ISSN
1350-4495
URI
https://pubs.kist.re.kr/handle/201004/134585
DOI
10.1016/j.infrared.2006.06.032
Appears in Collections:
KIST Article > 2007
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