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Effect of Thermal Stress on the Microwave Dielectric Properties of (300-x) nm MgTiO3/(x) nm CaTiO3 Thin Films

Authors

윤기현; 최지원

Issue Date

2006-10

Citation

Advances in Science and Technology, v.45, pp.2332 - 2336

Keywords

Thermal stress; Microwave dielectrics; Dielectric loss; Dielectric layer

ISSN

1661-819X

URI

https://pubs.kist.re.kr/handle/201004/135042

Appears in Collections:

KIST Article > 2006

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