Ultrathin silicon micropackaging for RF MEMS devices

Authors
Kim, YKPark, YKKim, JKKim, SWJu, BK
Issue Date
2006-09
Publisher
ELECTROCHEMICAL SOC INC
Citation
ELECTROCHEMICAL AND SOLID STATE LETTERS, v.9, no.2, pp.G44 - G48
Abstract
In this paper we report a technology for lightweight, small radio-frequency (rf) microelectromechanical system packaging with a short electrical path length. We used an ultrathin silicon substrate as the packaging substrate. Via holes for vertical feed-through were fabricated on the thin silicon wafer. Then, bottom-up gold electroplating was applied to fill via holes. For hermetic sealing, gold-gold direct metal bonding was used in the sealing line. The packaged rf device has a reflection loss below -22 dB and an insertion loss of -0.05 to -0.08 dB. Therefore, with the ultrathin silicon wafer, a lightweight, small device package can be constructed.
Keywords
ultrathin; micropackaging; mems
ISSN
1099-0062
URI
https://pubs.kist.re.kr/handle/201004/135180
DOI
10.1149/1.2150166
Appears in Collections:
KIST Article > 2006
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