The challenges in guided self-assembly of Ge and InAs quantum dots on Si

Authors
Zhao, Z. M.Yoon, T. S.Feng, W.Li, B. Y.Kim, J. H.Liu, J.Hulko, O.Xie, Y. H.Kim, H. M.Kim, K. B.Kim, H. J.Wang, K. L.Ratsch, C.Caflisch, R.Ryu, D. Y.Russell, T. P.
Issue Date
2006-06-05
Publisher
ELSEVIER SCIENCE SA
Citation
THIN SOLID FILMS, v.508, no.1-2, pp.195 - 199
Abstract
The topic of guided self-assembly of Ge and InAs quantum dots on Si (001) substrates via epitaxy is discussed. A buried misfit dislocation network can be used to guide the assembly process through the associated strain field. Patterned substrates can also be used to guide the assembly process. This paper discusses the recent experimental and theoretical studies of the guided assembly process with an emphasis on what remains to be understood. (c) 2005 Elsevier B.V. All rights reserved.
Keywords
SI(001); ISLANDS; SURFACE; GROWTH; ARRAYS; SI(001); ISLANDS; SURFACE; GROWTH; ARRAYS; Ge; InAs; quantum dots; self-assembly
ISSN
0040-6090
URI
https://pubs.kist.re.kr/handle/201004/135408
DOI
10.1016/j.tsf.2005.08.407
Appears in Collections:
KIST Article > 2006
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