Evolution of crystallographic orientations in an aluminum single crystal during tensile deformation
- Authors
- Han, JH; Kim, DI; Jee, KK; Oh, KH
- Issue Date
- 2004-12-15
- Publisher
- ELSEVIER SCIENCE SA
- Citation
- MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.387, pp.60 - 63
- Abstract
- The evolution of the surface relief and the crystallographic orientations were investigated in a pure aluminum single crystal during in situ uniaxial tensile deformation inside a scanning electron microscope using an electron backscattered diffraction (EBSD) system. The operative slip systems were determined from the EBSD measurement in the deformation bands. Domains of two types form during inhomogeneous deformation showing a different orientation rotation behavior developing with increasing strain. The formation of the domains is caused by the rotation of local crystal areas due to the intersection of the primary and secondary slip systems. (C) 2004 Elsevier B.V. All rights reserved.
- Keywords
- X-RAY-DIFFRACTION; BEHAVIOR; X-RAY-DIFFRACTION; BEHAVIOR; single crystal; EBSD; in situ deformation in SEM; orientation rotation; deformation band
- ISSN
- 0921-5093
- URI
- https://pubs.kist.re.kr/handle/201004/136914
- DOI
- 10.1016/j.msea.2004.01.083
- Appears in Collections:
- KIST Article > 2004
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