MBE growth and optical properties of digital-alloy 1.55 mu m multi-quantum wells

Authors
Song, JDChoi, WJKim, JMChang, KSLee, YT
Issue Date
2004-10-01
Publisher
ELSEVIER SCIENCE BV
Citation
JOURNAL OF CRYSTAL GROWTH, v.270, no.3-4, pp.295 - 300
Abstract
Using digital-alloy InGaAlAs, 1.55 mum InGaAs/InGaAlAs multi-quantum wells were fabricated. It was found that the linewidth of 10-photoluminescence (PL) (5.7meV) is narrower than that of conventional InGaAs/In(Ga)AIAs multi-quantum wells grown using present state-of-the-art growth methods. The narrower linewidth is attributed to the elongated effective-well-width and the increased 3 dimensional properties, due to carrier tunneling through the digital-alloy InGaAIAs barrier. The standard deviation of 300 K-PL peak wavelengths over the entire 2-in. wafer is 1.8 rim and the area ratio of the uniform PL peak intensity is approximately 64% of the entire wafer. This is the first report on this material system. (C) 2004 Elsevier B.V. All rights reserved.
Keywords
MOLECULAR-BEAM EPITAXY; DECOMPOSITION SOURCES; QUANTUM-WELLS; LASERS; GAP; INP; HETEROSTRUCTURES; SUPERLATTICES; GAAS; MOLECULAR-BEAM EPITAXY; DECOMPOSITION SOURCES; QUANTUM-WELLS; LASERS; GAP; INP; HETEROSTRUCTURES; SUPERLATTICES; GAAS; characterization; decomposition sources; molecular beam epitaxy; quantum wells; semiconducting III-V materials
ISSN
0022-0248
URI
https://pubs.kist.re.kr/handle/201004/137148
DOI
10.1016/j.jcrysgro.2004.06.037
Appears in Collections:
KIST Article > 2004
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