Far-infrared reflectivity spectra and influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies

Authors
Yoo, SHYoon, KHChoi, JWYoon, SJ
Issue Date
2004-03-01
Publisher
INST PURE APPLIED PHYSICS
Citation
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.43, no.3A, pp.L343 - L345
Abstract
The influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies via far-infrared reflectivity spectra and X-ray diffraction was investigated as a function of cooling rate. As the cooling rate increased, the crystallographic strain increased and Q(.)f value decreased, which were confirmed via X-ray diffraction and far-infrared reflectivity spectra. This result was attributed to the thermally induced strain and lattice anharmonicity.
Keywords
DIELECTRIC-PROPERTIES; THIN-FILMS; TITANATE; SPECTROSCOPY; SRTIO3; HZ; DIELECTRIC-PROPERTIES; THIN-FILMS; TITANATE; SPECTROSCOPY; SRTIO3; HZ; quality factor; far infrared reflectivity spectra; XRD; MgTiO3; thermal strain; cooling rate; lattice anharmonicity
ISSN
0021-4922
URI
https://pubs.kist.re.kr/handle/201004/137773
DOI
10.1143/JJAP.43.L343
Appears in Collections:
KIST Article > 2004
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