Far-infrared reflectivity spectra and influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies
- Authors
- Yoo, SH; Yoon, KH; Choi, JW; Yoon, SJ
- Issue Date
- 2004-03-01
- Publisher
- INST PURE APPLIED PHYSICS
- Citation
- JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.43, no.3A, pp.L343 - L345
- Abstract
- The influence of thermally induced strain on quality factor of MgTiO3 ceramics at microwave frequencies via far-infrared reflectivity spectra and X-ray diffraction was investigated as a function of cooling rate. As the cooling rate increased, the crystallographic strain increased and Q(.)f value decreased, which were confirmed via X-ray diffraction and far-infrared reflectivity spectra. This result was attributed to the thermally induced strain and lattice anharmonicity.
- Keywords
- DIELECTRIC-PROPERTIES; THIN-FILMS; TITANATE; SPECTROSCOPY; SRTIO3; HZ; DIELECTRIC-PROPERTIES; THIN-FILMS; TITANATE; SPECTROSCOPY; SRTIO3; HZ; quality factor; far infrared reflectivity spectra; XRD; MgTiO3; thermal strain; cooling rate; lattice anharmonicity
- ISSN
- 0021-4922
- URI
- https://pubs.kist.re.kr/handle/201004/137773
- DOI
- 10.1143/JJAP.43.L343
- Appears in Collections:
- KIST Article > 2004
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