Dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots

Authors
Lee, CYSong, JDKim, JMChang, KSLee, YTKim, TW
Issue Date
2004-01-03
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
MATERIALS RESEARCH BULLETIN, v.39, no.1, pp.135 - 139
Abstract
Temperature-dependent photoluminescence (PL) measurements have been carried out to investigate the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots (QDs). The PL spectra showed that the peak corresponding to the interband transitions form the ground electronic subband to the ground heavy-hole band (E-0-HH1) of the InAs QDs shifted to a higher energy side with increasing the GaAs spacer thickness and that the full width at maximum (FWHM) of the (E-0-HH1) peak rapidly decreased with increasing a spacer thickness. The position energy and the FWHM of the (E-0-HH1) peak for the InAs/GaAs QDs at several temperatures were observed. The present observations can help improve understanding of the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs QDs. (C) 2003 Elsevier Ltd. All rights reserved.
Keywords
HETEROSTRUCTURES; HETEROSTRUCTURES; nanostrucutres; epitaxial growth; optical properties
ISSN
0025-5408
URI
https://pubs.kist.re.kr/handle/201004/137940
DOI
10.1016/j.materresbull.2003.07.013
Appears in Collections:
KIST Article > 2004
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