Dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots
- Authors
- Lee, CY; Song, JD; Kim, JM; Chang, KS; Lee, YT; Kim, TW
- Issue Date
- 2004-01-03
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Citation
- MATERIALS RESEARCH BULLETIN, v.39, no.1, pp.135 - 139
- Abstract
- Temperature-dependent photoluminescence (PL) measurements have been carried out to investigate the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs quantum dots (QDs). The PL spectra showed that the peak corresponding to the interband transitions form the ground electronic subband to the ground heavy-hole band (E-0-HH1) of the InAs QDs shifted to a higher energy side with increasing the GaAs spacer thickness and that the full width at maximum (FWHM) of the (E-0-HH1) peak rapidly decreased with increasing a spacer thickness. The position energy and the FWHM of the (E-0-HH1) peak for the InAs/GaAs QDs at several temperatures were observed. The present observations can help improve understanding of the dependence of the optical properties on the GaAs spacer thickness for vertically stacked InAs/GaAs QDs. (C) 2003 Elsevier Ltd. All rights reserved.
- Keywords
- HETEROSTRUCTURES; HETEROSTRUCTURES; nanostrucutres; epitaxial growth; optical properties
- ISSN
- 0025-5408
- URI
- https://pubs.kist.re.kr/handle/201004/137940
- DOI
- 10.1016/j.materresbull.2003.07.013
- Appears in Collections:
- KIST Article > 2004
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