Synthesis and magnetic properties of Zn1-xMnxO films prepared by the sol-gel method
- Authors
- Kim, YM; Yoon, M; Park, IW; Park, YJ; Lyou, JH
- Issue Date
- 2004-01
- Publisher
- PERGAMON-ELSEVIER SCIENCE LTD
- Citation
- SOLID STATE COMMUNICATIONS, v.129, no.3, pp.175 - 178
- Abstract
- We report on the ferromagnetic characteristics of Znl-xMnxO films (x = 0.1-0.3) prepared by the sol-gel method on silicon substrates using transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), X-ray diffractometry (XRD) and superconducting quantum interference device (SQUID) magnetometry at various temperatures. Magnetic measurement show that the Curie temperature (T-C) and the coercive field (H-C) were similar to 39 K and similar to 2100 Oe for the film of x = 0.2, respectively. EDS and TEM measurements indicate that Mn content at the interface is significantly higher than that at the center of the Zn0.8Mn0.2O film showing the ratio, Zn:Mn:O congruent to 1:12:15. This experimental evidence suggests that ferromagnetic precipitates containing manganese oxide may be responsible for the observed ferromagnetic behavior of the film. (C) 2003 Elsevier Ltd. All rights reserved.
- Keywords
- ZNO FILMS; DOPED ZNO; SEMICONDUCTORS; ZNO FILMS; DOPED ZNO; SEMICONDUCTORS; ZnO; diluted magnetic semiconductor; manganese oxide; sol-gel; energy dispersive spectroscopy
- ISSN
- 0038-1098
- URI
- https://pubs.kist.re.kr/handle/201004/137974
- DOI
- 10.1016/j.ssc.2003.09.035
- Appears in Collections:
- KIST Article > 2004
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