Synthesis and magnetic properties of Zn1-xMnxO films prepared by the sol-gel method

Authors
Kim, YMYoon, MPark, IWPark, YJLyou, JH
Issue Date
2004-01
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
SOLID STATE COMMUNICATIONS, v.129, no.3, pp.175 - 178
Abstract
We report on the ferromagnetic characteristics of Znl-xMnxO films (x = 0.1-0.3) prepared by the sol-gel method on silicon substrates using transmission electron microscopy (TEM), energy dispersive spectroscopy (EDS), X-ray diffractometry (XRD) and superconducting quantum interference device (SQUID) magnetometry at various temperatures. Magnetic measurement show that the Curie temperature (T-C) and the coercive field (H-C) were similar to 39 K and similar to 2100 Oe for the film of x = 0.2, respectively. EDS and TEM measurements indicate that Mn content at the interface is significantly higher than that at the center of the Zn0.8Mn0.2O film showing the ratio, Zn:Mn:O congruent to 1:12:15. This experimental evidence suggests that ferromagnetic precipitates containing manganese oxide may be responsible for the observed ferromagnetic behavior of the film. (C) 2003 Elsevier Ltd. All rights reserved.
Keywords
ZNO FILMS; DOPED ZNO; SEMICONDUCTORS; ZNO FILMS; DOPED ZNO; SEMICONDUCTORS; ZnO; diluted magnetic semiconductor; manganese oxide; sol-gel; energy dispersive spectroscopy
ISSN
0038-1098
URI
https://pubs.kist.re.kr/handle/201004/137974
DOI
10.1016/j.ssc.2003.09.035
Appears in Collections:
KIST Article > 2004
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE