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dc.contributor.authorKim, JY-
dc.contributor.authorPark, JY-
dc.contributor.authorSeo, JH-
dc.contributor.authorWhang, CN-
dc.contributor.authorKang, HJ-
dc.contributor.authorKim, SS-
dc.contributor.authorChoi, DS-
dc.contributor.authorChae, KH-
dc.date.accessioned2024-01-21T08:45:16Z-
dc.date.available2024-01-21T08:45:16Z-
dc.date.created2021-09-03-
dc.date.issued2003-05-10-
dc.identifier.issn0039-6028-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/138579-
dc.description.abstractThe atomic structure of Cs atoms adsorbed on the Si(0 0 1)(2 x 1) surface has been investigated by coaxial impact collision ion scattering spectroscopy. When 0.5 ML of Cs atoms are adsorbed on Si(0 0 1). at room temperature, it is found that Cs atoms occupy a single absorption site on T3 with a height of 3.18 +/- 0.05 Angstrom from the second layer of Si(0 0 1)(2 x 1) surface, and the bond length between Cs and the nearest Si atoms is 3.71 +/- 0.05 Angstrom. (C) 2003 Elsevier Science B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE BV-
dc.subjectENERGY ELECTRON-DIFFRACTION-
dc.subjectPHOTOELECTRON DIFFRACTION-
dc.subjectION-SCATTERING-
dc.subjectCOVERAGE-
dc.subjectSPECTROSCOPY-
dc.subjectADSORPTION-
dc.subjectCESIUM-
dc.subject2X1-
dc.titleAtomic structure of Cs layer grown on Si(001)(2 x 1) surface at room temperature-
dc.typeArticle-
dc.identifier.doi10.1016/S0039-6028(03)00378-9-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSURFACE SCIENCE, v.531, no.1, pp.L340 - L346-
dc.citation.titleSURFACE SCIENCE-
dc.citation.volume531-
dc.citation.number1-
dc.citation.startPageL340-
dc.citation.endPageL346-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000182744400003-
dc.identifier.scopusid2-s2.0-0037431531-
dc.relation.journalWebOfScienceCategoryChemistry, Physical-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
dc.subject.keywordPlusENERGY ELECTRON-DIFFRACTION-
dc.subject.keywordPlusPHOTOELECTRON DIFFRACTION-
dc.subject.keywordPlusION-SCATTERING-
dc.subject.keywordPlusCOVERAGE-
dc.subject.keywordPlusSPECTROSCOPY-
dc.subject.keywordPlusADSORPTION-
dc.subject.keywordPlusCESIUM-
dc.subject.keywordPlus2X1-
dc.subject.keywordAuthorsurface structure, morphology, roughness, and topography-
dc.subject.keywordAuthorsilicon-
dc.subject.keywordAuthoralkali metals-
dc.subject.keywordAuthorlow energy ion scattering (LEIS)-
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