Structural characteristics of new high-Q (1-x)(Al1/2Ta1/2)O-2-x(Mg1/3Ta2/3)O-2 (0.2 < x < 1.0)

Authors
Choi, JWHa, JYKang, CYYoon, SJKim, HJYoon, KH
Issue Date
2003-04-10
Publisher
ELSEVIER SCIENCE SA
Citation
MATERIALS CHEMISTRY AND PHYSICS, v.79, no.2-3, pp.243 - 246
Abstract
The crystal structure and microstructure of microwave dielectric (1-x)(Al1/2Ta1/2)O-2-x(Mg1/3Ta2/3)O-2 (0.2 less than or equal to x less than or equal to 1.0) ceramics have been investigated. It is reported in the JCPDS cards that (Al1/2Ta1/2)O-2 and (Mg1/3Ta2/3)O-2 have orthorhombic and tetragonal structure, respectively. (1-x)(Al1/2Ta1/2)O-2-x(Mg1/3Ta2/3)O-2 ceramics had two phases of orthorhombic and tetragonal allow (Mg1/3Ta2/3)O-2 concentration but as (Mg1/3Ta2/3)O-2 concentration increased, (1- x)(Al1/2Ta1/2)O2-x(Mg1/3Ta2/3)O-2 transformed into tetragonal structure. Specimens having tetragonal single phase could be obtained over x = 0.6. As (Mg1/3Ta2/3)O-2 concentration increased, the cell parameters, X-ray density, and the grain size increased. However, apparent density increased from 0.2 to 0.65 concentration of (Mg1/3Ta2/3)O-2 and then decreased over 0.65 concentration of (Mg1/3Ta2/3)O-2. The number and size of pores in grains also decreased from 0.2 to 0.65 concentration of (Mg1/3Ta2/3)O-2 and then increased over 0.65 concentration of (Mg1/3Ta2/3)O-2. It is expected that the relationship between structural characteristics and microwave dielectric characteristics have a good correlation. (C) 2002 Elsevier Science B.V. All rights reserved.
Keywords
MICROWAVE; MICROWAVE; (1-x)(Al1/2Ta1/2)O-2-x(Mg1/3Ta2/3)O-2; cell parameters; X-ray density; grain size; tetragonal structure
ISSN
0254-0584
URI
https://pubs.kist.re.kr/handle/201004/138645
DOI
10.1016/S0254-0584(02)00287-0
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KIST Article > 2003
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