DSpace at KIST: Electromigration-induced failure in near-bamboo interconnects

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DC Field	Value	Language
dc.contributor.author	박영준	-
dc.date.accessioned	2024-01-21T12:11:23Z	-
dc.date.available	2024-01-21T12:11:23Z	-
dc.date.created	2022-01-10	-
dc.date.issued	2001-06	-
dc.identifier.issn	1738-8228	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/140403	-
dc.publisher	대한금속.재료학회	-
dc.title	Electromigration-induced failure in near-bamboo interconnects	-
dc.title.alternative	Electromigration 에 의한 near-bamboo 배선의 파손	-
dc.type	Article	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	대한금속 . 재료학회지 = Journal of the Korean Institute of Metals and Materials, v.39, no.6, pp.707 - 711	-
dc.citation.title	대한금속 . 재료학회지 = Journal of the Korean Institute of Metals and Materials	-
dc.citation.volume	39	-
dc.citation.number	6	-
dc.citation.startPage	707	-
dc.citation.endPage	711	-
dc.description.journalRegisteredClass	kci	-
dc.subject.keywordAuthor	electromigration	-

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