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DSpace at KISTKIST Article 2001

Crystallographic texture evolution of hexagonal CoCrMn thin films depending on the Mn content and processing parameters

Authors: Song, HJ; Shin, KH; Kwon, SJ

Issue Date: 2001-05

Publisher: ELSEVIER SCIENCE BV

Citation: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.226, pp.1666 - 1668

Abstract: Texture of CoCrMn alloy thin films with varing Mn content was investigated by X-ray diffraction. HCP (Co64Cr36)(100-x)Mn-x (5 <x < 12) thin films showed the spontaneous in-plane texture when grown on a heated glass substrate. Strong (10 (1) over bar0) texture of CoCrMn thin films appeared only with proper Mn addition While Co64Cr36 thin film showed random orientation. (C) 2001 Elsevier Science B.V. All rights reserved.

Keywords: texture; thin films-sputtered; X-ray diffraction; transition metal-ternary compounds

ISSN: 0304-8853

URI: https://pubs.kist.re.kr/handle/201004/140501

DOI: 10.1016/S0304-8853(00)01376-7

Appears in Collections:: KIST Article > 2001

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