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dc.contributor.author김용-
dc.contributor.author박경화-
dc.contributor.author정태훈-
dc.contributor.author박홍준-
dc.contributor.author이재열-
dc.contributor.author최원철-
dc.contributor.author김은규-
dc.date.accessioned2024-01-21T12:33:47Z-
dc.date.available2024-01-21T12:33:47Z-
dc.date.created2022-01-10-
dc.date.issued2001-04-
dc.identifier.issn1225-8822-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/140540-
dc.languageKorean-
dc.publisher한국진공학회-
dc.title급속열처리산화법으로 형성시킨 SiO₂/나노결정 Si의 전기적 특성 연구-
dc.title.alternativeElectrical properties of metal-oxide-semiconductor structures containing Si nanocrystals fabricated by rapid thermal oxidation process.-
dc.typeArticle-
dc.description.journalClass2-
dc.identifier.bibliographicCitation한국진공학회지, v.10, no.1, pp.44 - 50-
dc.citation.title한국진공학회지-
dc.citation.volume10-
dc.citation.number1-
dc.citation.startPage44-
dc.citation.endPage50-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassother-
dc.subject.keywordAuthor급속열처리산화-
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KIST Article > 2001
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