Ultralarge capacitance-voltage hysteresis and charge retention characteristics in metal oxide semiconductor structure containing nanocrystals deposited by ion-beam-assisted electron beam deposition
- Authors
- Kim, Y; Park, KH; Chung, TH; Bark, HJ; Yi, JY; Choi, WC; Kim, EK; Lee, JW; Lee, JY
- Issue Date
- 2001-02-12
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.78, no.7, pp.934 - 936
- Abstract
- Amorphous silicon films are deposited by ion-beam-assisted electron beam deposition and subsequently oxidized by a rapid thermal oxidation process. The oxidized film contains a large density of nanocrystals specifically localized at a certain depth from the Si/SiOx interface, whereas no evidence of nanocrystals is found for oxidized films deposited without ion beam assistance. Such a marked contrast resulted from the enhancement of nucleation rate by ion beam irradiation. The metal-oxide-semiconductor structure utilizing the film shows an ultralarge capacitance-voltage hysteresis whose width is over 20 V. In addition capacitance-time measurement shows a characteristic capacitance transient indicating nondispersive carrier relaxation. The retention time shows a dependence on applied bias and the maximum time of similar to 70 s is obtained near midgap voltage. The retention time dependence on applied bias and large capacitance-voltage hysteresis are attributed to direct tunneling of trapped charges in the deep traps of nanocrystals to the interface states. (C) 2001 American Institute of Physics.
- Keywords
- CHEMICAL-VAPOR-DEPOSITION; SILICON NANOCRYSTALS; GE NANOCRYSTALS; MEMORY; SIO2-FILMS; TRAPS; THIN; CHEMICAL-VAPOR-DEPOSITION; SILICON NANOCRYSTALS; GE NANOCRYSTALS; MEMORY; SIO2-FILMS; TRAPS; THIN; amorphous Si
- ISSN
- 0003-6951
- URI
- https://pubs.kist.re.kr/handle/201004/140708
- DOI
- 10.1063/1.1337618
- Appears in Collections:
- KIST Article > 2001
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