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dc.contributor.author주병권-
dc.contributor.author이덕중-
dc.contributor.author이윤희-
dc.date.accessioned2024-01-21T14:10:04Z-
dc.date.available2024-01-21T14:10:04Z-
dc.date.created2022-01-10-
dc.date.issued2000-04-
dc.identifier.issn1226-9360-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/141471-
dc.publisher한국마이크로전자 및 패키징학회-
dc.titleVacuum-electrostatic bonding properties of glass-to-glass substrates-
dc.title.alternative유리-유리 기판의 진공-정전 열 접합 특성-
dc.typeArticle-
dc.description.journalClass2-
dc.identifier.bibliographicCitation마이크로전자 및 패키징학회지 = Journal of Microelectronics and Packaging Society, v.7, no.1, pp.7 - 12-
dc.citation.title마이크로전자 및 패키징학회지 = Journal of Microelectronics and Packaging Society-
dc.citation.volume7-
dc.citation.number1-
dc.citation.startPage7-
dc.citation.endPage12-
dc.subject.keywordAuthorwafer bonding-
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KIST Article > 2000
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