DSpace at KISTKIST ArticleOthers

Full metadata record

DC Field Value Language
dc.contributor.author황성민-
dc.contributor.author이주영-
dc.contributor.author김은규-
dc.contributor.author강동훈-
dc.contributor.author최인훈-
dc.contributor.author김용-
dc.date.accessioned2024-01-21T15:05:29Z-
dc.date.available2024-01-21T15:05:29Z-
dc.date.created2022-01-10-
dc.date.issued1999-09-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/141931-
dc.titleMeasurement of the crystallinity and the optical properties for wafer-fused GaAs epilayers on InP substrates-
dc.title.alternativeInP 위에 wafer fusion된 GaAs 에피층의 결정성 및 광학적 특성 연구-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation응용물리, v.12, no.5, pp.472 - 477-
dc.citation.title응용물리-
dc.citation.volume12-
dc.citation.number5-
dc.citation.startPage472-
dc.citation.endPage477-
dc.subject.keywordAuthorInP-
dc.subject.keywordAuthorwafer fusion-
dc.subject.keywordAuthorGaAs epi-layer-
dc.subject.keywordAuthorcrystallinity-
dc.subject.keywordAuthoroptical property-
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE