Measurement of the crystallinity and the optical properties for wafer-fused GaAs epilayers on InP substrates

Other Titles
InP 위에 wafer fusion된 GaAs 에피층의 결정성 및 광학적 특성 연구
Authors
황성민이주영김은규강동훈최인훈김용
Issue Date
1999-09
Citation
응용물리, v.12, no.5, pp.472 - 477
Keywords
InP; wafer fusion; GaAs epi-layer; crystallinity; optical property
URI
https://pubs.kist.re.kr/handle/201004/141931
Appears in Collections:
KIST Article > Others
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