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dc.contributor.authorChai, KH-
dc.contributor.authorHeo, NH-
dc.contributor.authorNa, JG-
dc.contributor.authorJeong, HT-
dc.contributor.authorLee, SR-
dc.date.accessioned2024-01-21T15:07:22Z-
dc.date.available2024-01-21T15:07:22Z-
dc.date.created2021-09-05-
dc.date.issued1999-09-
dc.identifier.issn0018-9464-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/141964-
dc.description.abstractDuring final annealing at 1200 degrees C under a high vacuum, changes in recrystallization texture with final annealing time were observed in thin-gauged 3% Si-Fe alloys. In the alloy containing 30 ppm bulk sulfur, the recrystallization texture varied from the {111} <uvw> to the {001} <uvw> and finally to the {110} <001> Goss texture, resulting in higher magnetic induction than 1.90 T. The trough in magnetic induction, which corresponds to the relatively high surface-segregated sulfur range, is due to the magnetically detrimental effect of those textures, i.e. the {111} <uvw> and the {001} <uvw>. In the alloy containing 6 ppm bulk sulfur, the correlation between magnetic induction and surface-segregated sulfur was the same as that in the other alloy. These results clearly indicate that the surface energy induced recrystallization in the thin-gauged 3% Si-Fe alloys is strongly affected by the segregation and the evaporation of sulfur.-
dc.languageEnglish-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.subjectSURFACE SEGREGATION-
dc.titleEffects of segregated sulfur on recrystallization texture and magnetic induction in thin-gauged 3% silicon steel-
dc.typeArticle-
dc.identifier.doi10.1109/20.800528-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON MAGNETICS, v.35, no.5, pp.3373 - 3375-
dc.citation.titleIEEE TRANSACTIONS ON MAGNETICS-
dc.citation.volume35-
dc.citation.number5-
dc.citation.startPage3373-
dc.citation.endPage3375-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000083151500046-
dc.identifier.scopusid2-s2.0-0033184068-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusSURFACE SEGREGATION-
dc.subject.keywordAuthorsulfur segregation-
dc.subject.keywordAuthorsurface energy-
dc.subject.keywordAuthorrecrystallization-
dc.subject.keywordAuthor3% Si-Fe-
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