DSpace at KIST: 복소유전율 측정용 개방단말 동축선 프로브 제작오차의 영향에 관한 FDTD 모의계산

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DC Field	Value	Language
dc.contributor.author	신현	-
dc.contributor.author	현승엽	-
dc.contributor.author	김상욱	-
dc.contributor.author	김세윤	-
dc.date.accessioned	2024-01-21T15:09:55Z	-
dc.date.available	2024-01-21T15:09:55Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1999-08	-
dc.identifier.issn	1016-135X	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/142009	-
dc.language	Korean	-
dc.publisher	대한전자공학회	-
dc.title	복소유전율 측정용 개방단말 동축선 프로브 제작오차의 영향에 관한 FDTD 모의계산	-
dc.title.alternative	FDTD simulation on the effect of manufacturing error of an open-ended coaxial probe for measuring complex permittivity	-
dc.type	Article	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	전자공학회논문지, v.36D, no.8, pp.691 - 698	-
dc.citation.title	전자공학회논문지	-
dc.citation.volume	36D	-
dc.citation.number	8	-
dc.citation.startPage	691	-
dc.citation.endPage	698	-
dc.description.isOpenAccess	N	-
dc.description.journalRegisteredClass	other	-
dc.subject.keywordAuthor	복소유전율	-

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