Transition of the anisotropic magnetoresistance of permalloy films from the negative to the positive along with thickness

Authors
Sung, GPark, CMShin, KH
Issue Date
1999-04-15
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF APPLIED PHYSICS, v.85, no.8, pp.5786 - 5788
Abstract
The anisotropic magnetoresistance of dc magnetron-sputtered Ni80Fe20 permalloy films showed the evolutionary transition of the sign, from the negative magnetoresistance to the positive magnetoresistance (PMR), as the thickness increases. A similar phenomenon with the angle between the field and the current was recently reported. In our study, however, the transition occurred in the transverse measurement at the fixed angle of 90 degrees. Ni80Fe20 films were deposited on Si substrates in a magnetic field of 300 Oe at the ambient temperature and at the deposition rate of 4 Angstrom/s. Because the PMR was known to be peculiar to the longitudinal measurement, it was investigated why the PMR in the transverse measurement occurred. By a vibrating sample magnetometer and magnetic force microscope, the PMR curve in the transverse measurement was found to be related to the canted hysteresis loop peculiar to the stripe domains caused by the perpendicular anisotropy. Unanticipated magnetostrictive strain by the compositional fluctuation and/or the effect of surface roughness was suggested as a plausible mechanism of the perpendicular anisotropy. (C) 1999 American Institute of Physics. [S0021-8979(99)26208-1].
Keywords
magnetoresistance; anisotropy; permalloy
ISSN
0021-8979
URI
https://pubs.kist.re.kr/handle/201004/142248
DOI
10.1063/1.369919
Appears in Collections:
KIST Article > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE