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dc.contributor.authorLee, JI-
dc.contributor.authorBrini, J-
dc.contributor.authorDimitriadis, CA-
dc.date.accessioned2024-01-21T17:02:24Z-
dc.date.available2024-01-21T17:02:24Z-
dc.date.created2021-09-01-
dc.date.issued1998-06-11-
dc.identifier.issn0013-5194-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143002-
dc.description.abstractSimple. on-site parameter extraction methods are proposed; the ideality factor, series resistance, leakage resistance and saturation current are determined from the current-voltage characteristics of a Shottky barrier diode.-
dc.languageEnglish-
dc.publisherIEE-INST ELEC ENG-
dc.subjectCONTACTS-
dc.titleSimple parameter extraction method for non-ideal Schottky barrier diodes-
dc.typeArticle-
dc.identifier.doi10.1049/el:19980831-
dc.description.journalClass1-
dc.identifier.bibliographicCitationELECTRONICS LETTERS, v.34, no.12, pp.1268 - 1269-
dc.citation.titleELECTRONICS LETTERS-
dc.citation.volume34-
dc.citation.number12-
dc.citation.startPage1268-
dc.citation.endPage1269-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000074639100077-
dc.identifier.scopusid2-s2.0-0032095866-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalResearchAreaEngineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusCONTACTS-
dc.subject.keywordAuthorSchottky barrier diode-
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