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dc.contributor.authorJang, PW-
dc.contributor.authorKim, DW-
dc.contributor.authorPark, CH-
dc.contributor.authorNa, JG-
dc.contributor.authorLee, SR-
dc.date.accessioned2024-01-21T17:02:59Z-
dc.date.available2024-01-21T17:02:59Z-
dc.date.created2021-09-03-
dc.date.issued1998-06-01-
dc.identifier.issn0021-8979-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143012-
dc.description.abstract(Co1-xFex)Pt films were grown on a glass substrate by a rf sputtering and then annealed at 650-700 degrees C in a high vacuum. All the as-sputtered (Co1-xFex)Pt films deposited below 400 degrees C had a disordered structure and showed very low coercivities. With increasing the deposition temperature and Fe contents, the (111) texture was weakened in as-deposited (Co1-xFex)Pt ternary filIns. Vibrating sample magnetometer and x-ray diffraction data show that Co atoms in the L1(o) CoPt phase were substituted with Fe atoms. In-plane coercivities of these films decreased almost linearly with increasing Fe content which seemed to be due to the decrease of a crystalline anisotropy energy. (C) 1998 American Institute of Physics.-
dc.languageEnglish-
dc.publisherAMER INST PHYSICS-
dc.titleMagnetic and structural properties of (Co1-xFex)Pt thin films-
dc.typeArticle-
dc.identifier.doi10.1063/1.367671-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF APPLIED PHYSICS, v.83, no.11, pp.6614 - 6616-
dc.citation.titleJOURNAL OF APPLIED PHYSICS-
dc.citation.volume83-
dc.citation.number11-
dc.citation.startPage6614-
dc.citation.endPage6616-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosid000077795500130-
dc.identifier.scopusid2-s2.0-0000821645-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordAuthorCoFePt thin film Da Magnetic anisotropy. L10 structure-
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