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dc.contributor.authorKim, GH-
dc.contributor.authorLee, JI-
dc.contributor.authorLee, JC-
dc.contributor.authorLee, HI-
dc.date.accessioned2024-01-21T18:02:09Z-
dc.date.available2024-01-21T18:02:09Z-
dc.date.created2021-09-05-
dc.date.issued1997-10-01-
dc.identifier.issn1359-6462-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143552-
dc.languageEnglish-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.subjectSILICON-
dc.titleMeasurements of Al concentration in the primary Si crystals from the rheocast Al-15.5 wt% Si alloy-
dc.typeArticle-
dc.identifier.doi10.1016/S1359-6462(97)00189-9-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSCRIPTA MATERIALIA, v.37, no.7, pp.929 - 936-
dc.citation.titleSCRIPTA MATERIALIA-
dc.citation.volume37-
dc.citation.number7-
dc.citation.startPage929-
dc.citation.endPage936-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997XW41400005-
dc.identifier.scopusid2-s2.0-0031257325-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.type.docTypeArticle-
dc.subject.keywordPlusSILICON-
dc.subject.keywordAuthorRheocast-
dc.subject.keywordAuthorlattice parameter-
dc.subject.keywordAuthorconvergent beam electron diffraction-
dc.subject.keywordAuthorlattice strain-
dc.subject.keywordAuthorAl-15.5 wt% Si alloy-
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