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dc.contributor.authorKim, BK-
dc.contributor.authorHahn, JW-
dc.contributor.authorHan, KR-
dc.date.accessioned2024-01-21T18:32:55Z-
dc.date.available2024-01-21T18:32:55Z-
dc.date.created2022-01-10-
dc.date.issued1997-04-15-
dc.identifier.issn0261-8028-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/143840-
dc.languageEnglish-
dc.publisherCHAPMAN HALL LTD-
dc.subjectX-RAY-DIFFRACTION-
dc.titleQuantitative phase analysis in tetragonal-rich tetragonal/monoclinic two phase zirconia by Raman spectroscopy-
dc.typeArticle-
dc.identifier.doi10.1023/A:1018587821260-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE LETTERS, v.16, no.8, pp.669 - 671-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE LETTERS-
dc.citation.volume16-
dc.citation.number8-
dc.citation.startPage669-
dc.citation.endPage671-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997WX59400024-
dc.identifier.scopusid2-s2.0-0031123412-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalResearchAreaMaterials Science-
dc.type.docTypeArticle-
dc.subject.keywordPlusX-RAY-DIFFRACTION-
dc.subject.keywordAuthorphase analysis-
dc.subject.keywordAuthortetragonal zirconia-
dc.subject.keywordAuthorRaman spectroscopy-
dc.subject.keywordAuthorY-TZP-
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