Emission characteristic of diamond-tip field emitter arrays fabricated by transfer mold technique

Authors
Kim, SJu, BKLee, YHPark, BSBaik, YJLim, SOh, MH
Issue Date
1997-03
Publisher
AMER INST PHYSICS
Citation
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.15, no.2, pp.499 - 502
Abstract
Wedge-shaped diamond-tip field emitter arrays were fabricated and characterized. The tip radius of the diamond emitter fabricated by using a silicon mold was about 300 Angstrom. The maximum current density of 800 mu A/cm(2) and the threshold voltage of 600 V were obtained from the diamond-tip held emitter array, which was a better electrical characteristic than that of a flat diamond film. The effects of vacuum pressure upon emission characteristics were investigated. The emission characteristic of the diamond-tip held emitter array was not varied over a wide range of vacuum pressure relatively to the hat diamond film. (C) 1997 American Vacuum Society.
Keywords
VACUUM MICROELECTRONICS; VACUUM MICROELECTRONICS; FED; field emission; diamond-tip; transfer mold technique
URI
https://pubs.kist.re.kr/handle/201004/143937
DOI
10.1116/1.589608
Appears in Collections:
KIST Article > Others
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