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dc.contributor.authorKim, JH-
dc.contributor.authorWang, L-
dc.contributor.authorZurn, SM-
dc.contributor.authorLi, L-
dc.contributor.authorYoon, YS-
dc.contributor.authorPolla, DL-
dc.date.accessioned2024-01-21T19:07:15Z-
dc.date.available2024-01-21T19:07:15Z-
dc.date.created2021-09-01-
dc.date.issued1997-01-
dc.identifier.issn1058-4587-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/144194-
dc.description.abstractThis paper discusses the fabrication process and challenges for fabrication of piezoelectric cantilever beam microaccelerometers by using surface micromachining techniques. PZT thin films were used as the piezoelectric material to detect the acceleration of the cantilever beam. In this paper, we discuss in detail the process challenges encountered in piezoelectric microaccelerometers. These major challenges include PZT thin film deposition and encapsulation during final micromachining membrane release.-
dc.languageEnglish-
dc.publisherGORDON BREACH SCI PUBL LTD-
dc.titleFabrication process of PZT piezoelectric cantilever unimorphs using surface micromachining-
dc.typeArticle-
dc.identifier.doi10.1080/10584589708015723-
dc.description.journalClass1-
dc.identifier.bibliographicCitationINTEGRATED FERROELECTRICS, v.15, no.1-4, pp.325 - 332-
dc.citation.titleINTEGRATED FERROELECTRICS-
dc.citation.volume15-
dc.citation.number1-4-
dc.citation.startPage325-
dc.citation.endPage332-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1997WR71500034-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.type.docTypeArticle-
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