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dc.contributor.author민병돈-
dc.contributor.author황성민-
dc.contributor.author손창식-
dc.contributor.author김성일-
dc.contributor.author김무성-
dc.contributor.author김은규-
dc.contributor.author민석기-
dc.contributor.author박만장-
dc.date.accessioned2024-01-21T19:36:25Z-
dc.date.available2024-01-21T19:36:25Z-
dc.date.created2022-01-10-
dc.date.issued1996-05-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/144456-
dc.title여러가지 기판방향에서 MOCVD 방법으로 성장한 GaAs 에피층의 탄소 도핑 특성-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation응용물리 = Ungyong Mulli (The Korean physical society), v.9, no.3, pp.372 - 376-
dc.citation.title응용물리 = Ungyong Mulli (The Korean physical society)-
dc.citation.volume9-
dc.citation.number3-
dc.citation.startPage372-
dc.citation.endPage376-
dc.subject.keywordAuthorMOCVD-
dc.subject.keywordAuthorGaAs epi-layer-
dc.subject.keywordAuthorcarbon doping-
dc.subject.keywordAuthorsubstrate orientation-
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