DSpace at KIST: Phase identification of the interfacial reaction product of SiC//p/Al composite using convergent beam electron diffraction technique.

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DC Field	Value	Language
dc.contributor.author	이정일	-
dc.contributor.author	이재철	-
dc.contributor.author	석현광	-
dc.contributor.author	이호인	-
dc.date.accessioned	2024-01-21T20:08:38Z	-
dc.date.available	2024-01-21T20:08:38Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1996-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/144773	-
dc.title	Phase identification of the interfacial reaction product of SiC//p/Al composite using convergent beam electron diffraction technique.	-
dc.title.alternative	수렴성 빔 전자회절법을 이용한 SiC//p/Al 복합재에서의 계면 생성물의 상분석 =	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	한국전자현미경학회지 = Korean J. electron microscopy, v.v. 26, no.no. 1, pp.95 - 104	-
dc.citation.title	한국전자현미경학회지 = Korean J. electron microscopy	-
dc.citation.volume	v. 26	-
dc.citation.number	no. 1	-
dc.citation.startPage	95	-
dc.citation.endPage	104	-
dc.subject.keywordAuthor	SiC//p/Al composite	-

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