DSpace at KIST: Advantages of Ruo//x bottom electrode in the dielectric and leakage characteristics of (Ba, Sr)TiO//3 capacitor.

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DC Field	Value	Language
dc.contributor.author	김용태	-
dc.contributor.author	이창우	-
dc.date.accessioned	2024-01-21T20:09:06Z	-
dc.date.available	2024-01-21T20:09:06Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1996-01	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/144781	-
dc.title	Advantages of Ruo//x bottom electrode in the dielectric and leakage characteristics of (Ba, Sr)TiO//3 capacitor.	-
dc.type	Article	-
dc.description.journalClass	3	-
dc.identifier.bibliographicCitation	Japanese journal of applied physics, v.v. 35, no.no. 12, pp.1246 - 1253	-
dc.citation.title	Japanese journal of applied physics	-
dc.citation.volume	v. 35	-
dc.citation.number	no. 12	-
dc.citation.startPage	1246	-
dc.citation.endPage	1253	-

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