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Advantages of Ruo//x bottom electrode in the dielectric and leakage characteristics of (Ba, Sr)TiO//3 capacitor.

Authors

김용태; 이창우

Issue Date

1996-01

Citation

Japanese journal of applied physics, v.v. 35, no.no. 12, pp.1246 - 1253

URI

https://pubs.kist.re.kr/handle/201004/144781

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KIST Article > Others

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