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dc.contributor.authorHariz, A.-
dc.contributor.authorKim, H.G.-
dc.contributor.authorHaskard, M.R.-
dc.contributor.authorChung, I.J.-
dc.date.accessioned2024-01-21T21:14:01Z-
dc.date.available2024-01-21T21:14:01Z-
dc.date.created2021-09-02-
dc.date.issued1995-01-
dc.identifier.issn0960-1317-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/145415-
dc.description.abstractVacuum microelectronics is an emerging and rapidly evolving technology. Characterized by field emission in vacuum microchambers, it has found applications in the display field, and more recently in sensor technology. In this paper we seek to report on a novel multidimensional method of utilizing field emission in acceleration sensors. Emission currents are directly related to, among other parameters, the distance separating the emission cathode and anode. When either or both electrodes are micromachined in a cantilever beam capable of deflection under the influence of an external force, the emission current detected will be a direct measure of force magnitude. Furthermore, we propose a design that will allow measurements of force components in three-dimensions. We present details of fabrication methods and theoretical concepts describing the mechanism proposed. ? 1995 IOP Publishing Ltd.-
dc.languageEnglish-
dc.subjectAcceleration sensors-
dc.subjectField emitter cathode-
dc.subjectFowler-Nordheim tunnelling equation-
dc.subjectVacuum microchambers-
dc.subjectVacuum microelectronics-
dc.subjectAcceleration-
dc.subjectElectric breakdown-
dc.subjectElectric currents-
dc.subjectElectric fields-
dc.subjectElectron tunneling-
dc.subjectFabrication-
dc.subjectMicroelectronics-
dc.subjectSensors-
dc.subjectThree dimensional-
dc.subjectVacuum-
dc.subjectCathodes-
dc.titleField-emitter cathode for acceleration sensors-
dc.typeArticle-
dc.identifier.doi10.1088/0960-1317/5/4/004-
dc.description.journalClass1-
dc.identifier.bibliographicCitationJournal of Micromechanics and Microengineering, v.5, no.4, pp.282 - 288-
dc.citation.titleJournal of Micromechanics and Microengineering-
dc.citation.volume5-
dc.citation.number4-
dc.citation.startPage282-
dc.citation.endPage288-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-0029517988-
dc.type.docTypeArticle-
dc.subject.keywordPlusAcceleration sensors-
dc.subject.keywordPlusField emitter cathode-
dc.subject.keywordPlusFowler-Nordheim tunnelling equation-
dc.subject.keywordPlusVacuum microchambers-
dc.subject.keywordPlusVacuum microelectronics-
dc.subject.keywordPlusAcceleration-
dc.subject.keywordPlusElectric breakdown-
dc.subject.keywordPlusElectric currents-
dc.subject.keywordPlusElectric fields-
dc.subject.keywordPlusElectron tunneling-
dc.subject.keywordPlusFabrication-
dc.subject.keywordPlusMicroelectronics-
dc.subject.keywordPlusSensors-
dc.subject.keywordPlusThree dimensional-
dc.subject.keywordPlusVacuum-
dc.subject.keywordPlusCathodes-
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