Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | LEE, YH | - |
dc.contributor.author | SHIN, YD | - |
dc.contributor.author | HERR, PH | - |
dc.contributor.author | LEE, KH | - |
dc.contributor.author | KIM, HJ | - |
dc.contributor.author | HAN, SH | - |
dc.contributor.author | KANG, IK | - |
dc.contributor.author | RHEE, JR | - |
dc.date.accessioned | 2024-01-21T21:31:09Z | - |
dc.date.available | 2024-01-21T21:31:09Z | - |
dc.date.created | 2021-09-02 | - |
dc.date.issued | 1994-11 | - |
dc.identifier.issn | 0018-9464 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/145475 | - |
dc.description.abstract | This paper reports on a method for measuring magnetostriction, Young's modulus of a substrate or film, and Delta E with one apparatus. A substrate with thin magnetic film deposited on it is in parallel with and cantilevered above a metal plate electrode, and they form a capacitive cell. The cantilever deflects due to own weight, applied electric and magnetic fields, The small change of capacitance caused by this deflection is measured by a sensitive capacitance bridge. Young's modulus, magnetostriction, and Delta E effect can be calculated by a theoretical analysis with the measured deflection data. | - |
dc.language | English | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | DC BIASED CAPACITANCE METHOD FOR MEASURING THIN-FILM MAGNETOSTRICTION AND DELTA-EPSILON-EFFECT | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/20.334150 | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON MAGNETICS, v.30, no.6, pp.4566 - 4568 | - |
dc.citation.title | IEEE TRANSACTIONS ON MAGNETICS | - |
dc.citation.volume | 30 | - |
dc.citation.number | 6 | - |
dc.citation.startPage | 4566 | - |
dc.citation.endPage | 4568 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.wosid | A1994PU42900248 | - |
dc.identifier.scopusid | 2-s2.0-0028548868 | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Physics | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordAuthor | thin film | - |
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