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dc.contributor.author박성우-
dc.contributor.authorDong-Hwan Kim-
dc.contributor.author김영만-
dc.contributor.author박병선-
dc.contributor.author한완수-
dc.contributor.author서배석-
dc.date.accessioned2024-01-21T22:04:20Z-
dc.date.available2024-01-21T22:04:20Z-
dc.date.created2022-01-10-
dc.date.issued1994-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/145801-
dc.titleSurface analysis of modified polymer samples by x-ray photoelectron spectroscopy and rutherford backscattering spectroscopy.-
dc.title.alternativeX- 선 광전자 분광법 및 라더포드 후방산란법에 의한 개질된 고분자 시료의 표면분석 =-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation분석과학회지 = Journal of the Korean Society of Analytical Sciences, v.v. 7, no.no. 3, pp.301 - 313.-
dc.citation.title분석과학회지 = Journal of the Korean Society of Analytical Sciences-
dc.citation.volumev. 7-
dc.citation.numberno. 3-
dc.citation.startPage301-
dc.citation.endPage313.-
dc.subject.keywordAuthorx-ray photoelectron spectroscopy and rutherford backscattering spectroscopy-
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