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dc.contributor.author윤능구-
dc.contributor.author황재웅-
dc.contributor.author고경현-
dc.contributor.author안재환-
dc.contributor.author제해준-
dc.contributor.author홍국선-
dc.date.accessioned2024-01-21T22:06:09Z-
dc.date.available2024-01-21T22:06:09Z-
dc.date.created2022-01-10-
dc.date.issued1994-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/145831-
dc.titleInterfacial defects in SiO₂-glass bond during VCR head fabrication-
dc.title.alternativeVCR 헤드 제조시 SiO₂ 박막과 유리의 계면 결함-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation한국재료학회지 = Korean journal of materials research, v.4, no.1, pp.31 - 36-
dc.citation.title한국재료학회지 = Korean journal of materials research-
dc.citation.volume4-
dc.citation.number1-
dc.citation.startPage31-
dc.citation.endPage36-
dc.subject.keywordAuthorVCR 헤드-
dc.subject.keywordAuthorVCR head-
dc.subject.keywordAuthorSiO₂ 박막-
dc.subject.keywordAuthorSiO₂ thin film-
dc.subject.keywordAuthor계면 결함-
dc.subject.keywordAuthorinteface defect-
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