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dc.contributor.authorJo, W.-
dc.contributor.authorCho, H.-J.-
dc.contributor.authorNoh, T.W.-
dc.contributor.authorCho, Y.S.-
dc.contributor.authorKwun, S.-I.-
dc.contributor.authorByun, Y.T.-
dc.contributor.authorKim, S.H.-
dc.date.accessioned2024-01-21T22:09:45Z-
dc.date.available2024-01-21T22:09:45Z-
dc.date.created2022-01-10-
dc.date.issued1994-01-
dc.identifier.issn0015-0193-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/145891-
dc.description.abstractFerroelectric bismuth titanate thin films have been deposited on LaA103, SrTi03, MgO, Al2O3, and ZrO2/SiO2/Si substrates using a Q-switched Nd:YAG laser. X-ray diffraction studies show that most films on single crystal substrates have preferential crystallographic orientation. The film on MgO(11O) shows large electrooptic characteristics with an effective electrooptic coefficient of about 3.8xl0-15 m2/V2. Using a lens coupling method, it is demonstrated that light can propagate along the Bi4Ti3O12 layer in a Bi4Ti3O12/ZrO2/SiO2/Si(100) heterostructure. ？ 1994, Taylor & Francis Group, LLC. All rights reserved.-
dc.languageEnglish-
dc.subjectBismuth compounds-
dc.subjectCrystal orientation-
dc.subjectDeposition-
dc.subjectElectric properties-
dc.subjectElectrooptical effects-
dc.subjectLight propagation-
dc.subjectOptical properties-
dc.subjectQ switched lasers-
dc.subjectRefractive index-
dc.subjectSubstrates-
dc.subjectThin films-
dc.subjectX ray analysis-
dc.subjectCrystallographic orientation-
dc.subjectElectro optic properties-
dc.subjectFerroelectric thin films-
dc.subjectHeterostructure-
dc.subjectLens coupling method-
dc.subjectX ray diffraction-
dc.subjectDielectric films-
dc.titleStudies on structural and electrooptic properties of ferroelectric bismuth titanate thin films-
dc.typeArticle-
dc.identifier.doi10.1080/00150199408017610-
dc.description.journalClass1-
dc.identifier.bibliographicCitationFerroelectrics, v.152, no.1, pp.139 - 144-
dc.citation.titleFerroelectrics-
dc.citation.volume152-
dc.citation.number1-
dc.citation.startPage139-
dc.citation.endPage144-
dc.description.journalRegisteredClassscopus-
dc.identifier.scopusid2-s2.0-0027927691-
dc.type.docTypeArticle-
dc.subject.keywordPlusBismuth compounds-
dc.subject.keywordPlusCrystal orientation-
dc.subject.keywordPlusDeposition-
dc.subject.keywordPlusElectric properties-
dc.subject.keywordPlusElectrooptical effects-
dc.subject.keywordPlusLight propagation-
dc.subject.keywordPlusOptical properties-
dc.subject.keywordPlusQ switched lasers-
dc.subject.keywordPlusRefractive index-
dc.subject.keywordPlusSubstrates-
dc.subject.keywordPlusThin films-
dc.subject.keywordPlusX ray analysis-
dc.subject.keywordPlusCrystallographic orientation-
dc.subject.keywordPlusElectro optic properties-
dc.subject.keywordPlusFerroelectric thin films-
dc.subject.keywordPlusHeterostructure-
dc.subject.keywordPlusLens coupling method-
dc.subject.keywordPlusX ray diffraction-
dc.subject.keywordPlusDielectric films-
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