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dc.contributor.authorSUH, KW-
dc.contributor.authorKIM, SG-
dc.contributor.authorKIM, SY-
dc.contributor.authorRA, JW-
dc.date.accessioned2024-01-21T23:10:41Z-
dc.date.available2024-01-21T23:10:41Z-
dc.date.created2021-08-31-
dc.date.issued1992-04-
dc.identifier.issn0895-2477-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/146456-
dc.description.abstractMicrowave imaging for dielectric objects under the Born approximation is suggested by using the computerized tomography based on projection. Limiting factors of degradation in reconstructed images are identified and explored in terms of projection function and necessary condition on the first-order Born approximation. To illustrate the usefulness of the presented method, simulation and experiment are performed in this article.-
dc.languageEnglish-
dc.publisherJOHN WILEY & SONS INC-
dc.titleMICROWAVE IMAGING FOR DIELECTRIC OBJECTS UNDER THE BORN APPROXIMATION BASED ON PROJECTION-
dc.typeArticle-
dc.identifier.doi10.1002/mop.4650050415-
dc.description.journalClass1-
dc.identifier.bibliographicCitationMICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.5, no.4, pp.194 - 198-
dc.citation.titleMICROWAVE AND OPTICAL TECHNOLOGY LETTERS-
dc.citation.volume5-
dc.citation.number4-
dc.citation.startPage194-
dc.citation.endPage198-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.identifier.wosidA1992HJ33200014-
dc.identifier.scopusid2-s2.0-0026852326-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.type.docTypeArticle-
dc.subject.keywordAuthorMICROWAVE IMAGING-
dc.subject.keywordAuthorCOMPUTERIZED TOMOGRAPHY-
dc.subject.keywordAuthorPROJECTION-
dc.subject.keywordAuthorINVERSE SCATTERING-
dc.subject.keywordAuthorCONVOLUTION BACK PROJECTION-
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