DSpace at KIST: Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry.

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DC Field	Value	Language
dc.contributor.author	김용	-
dc.contributor.author	김무성	-
dc.contributor.author	김상열	-
dc.contributor.author	엄경숙	-
dc.contributor.author	민석기	-
dc.date.accessioned	2024-01-22T00:05:21Z	-
dc.date.available	2024-01-22T00:05:21Z	-
dc.date.created	2022-01-10	-
dc.date.issued	1991-01	-
dc.identifier.issn	0374-4884	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/146919	-
dc.publisher	Korean Physical Society	-
dc.title	Characterization of a MOCVD grown GaAs/AlGaAs superlattice using spectroscopic ellipsometry.	-
dc.type	Article	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	Journal of the Korean Physical Society, v.v. 24, pp.359 - ?	-
dc.citation.title	Journal of the Korean Physical Society	-
dc.citation.volume	v. 24	-
dc.citation.startPage	359	-
dc.citation.endPage	?	-
dc.subject.keywordAuthor	spectroscopic ellipsometry	-
dc.subject.keywordAuthor	superlattice	-
dc.subject.keywordAuthor	MOCVD	-

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