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The shift of threshold voltage and subthreshold current curve in LDD MOSFET degraded under difference DC stress-biases.

Other Titles

DC 스트레스에 의해 노쇠화된 LDD MOSFET 에서 문턱진압과 subthreshold 전류곡선의 변화 =

Authors

강광남; 이명복; 이정일

Issue Date

1989-01

Citation

전자공학회논문지, v.v. 26, no.no. 5, pp.682 - ?

Keywords

MOSFET

URI

https://pubs.kist.re.kr/handle/201004/147422

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KIST Article > Others

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