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dc.contributor.author김은규-
dc.contributor.author조훈영-
dc.contributor.author민석기-
dc.contributor.author한철원-
dc.contributor.author박승철-
dc.date.accessioned2024-01-22T01:12:24Z-
dc.date.available2024-01-22T01:12:24Z-
dc.date.created2022-01-10-
dc.date.issued1988-02-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/147590-
dc.titleIsothermal capacitance transient spectroscopy (ICTS) 방법을 이용한 금속과 반도체 (GaAs) 접합의 계면상태에 관한 연구 .-
dc.typeArticle-
dc.description.journalClass3-
dc.identifier.bibliographicCitation새물리, v.v. 28, no.no. 1, pp.178 - 183-
dc.citation.title새물리-
dc.citation.volumev. 28-
dc.citation.numberno. 1-
dc.citation.startPage178-
dc.citation.endPage183-
dc.subject.keywordAuthorICTS-
dc.subject.keywordAuthorGaAs-
dc.subject.keywordAuthorinterface states-
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