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Isothermal capacitance transient spectroscopy (ICTS) 방법을 이용한 금속과 반도체 (GaAs) 접합의 계면상태에 관한 연구 .

Authors

김은규; 조훈영; 민석기; 한철원; 박승철

Issue Date

1988-02

Citation

새물리, v.v. 28, no.no. 1, pp.178 - 183

Keywords

ICTS; GaAs; interface states

URI

https://pubs.kist.re.kr/handle/201004/147590

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KIST Article > Others

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