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X-ray diffraction study of subgrain misorientation during high temperature creep of tin single crystla.

Authors

서상희; J. B. Cohen; J. Weertman

Issue Date

1983-01

Citation

Metallurgical transactions A, v.v. 14A, no.no. 1, pp.117 - 126

Keywords

X-ray diffraction; creep; tin; subgrain misorientation

URI

https://pubs.kist.re.kr/handle/201004/148100

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KIST Article > Others

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