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Quantification of the Crystal Fraction and Domain Orientation of Y-doped HfO2 Epitaxial Thin Film using Deep Learning-based Atomic Image Analysis

Authors

Choi, Haneul; Keun Won Lee; BAEK, SEUNG HYUB; Ki Sub Cho; Chang, Hye Jung

Issue Date

2025-05-29

Publisher

한국현미경학회

Citation

2025 현미경학회 춘계학술대회

URI

https://pubs.kist.re.kr/handle/201004/153423

Appears in Collections:

KIST Conference Paper > 2025

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