Voltage-circuit analysis in spin-torque ferromagnetic resonance
- Authors
- Han, Ki Hyuk; Yun, Deok Hyun; Jang, Seung-Hun; Ahn, Jeong Ung; Nah, Young-Jun; Kim, YongJin; Kang, Min-Gu; Hong, Seokmin; Koo, Hyun Cheol; Lee, OukJae
- Issue Date
- 2025-10
- Publisher
- American Institute of Physics Publising LLC
- Citation
- APL Materials, v.13, no.10
- Abstract
- Spin-orbit torque (SOT) enables efficient control of magnetization via spin-orbit coupling effects, so that accurate quantification of its efficiency is crucial for the development of spin-orbit devices. Among various characterization techniques, spin-torque ferromagnetic resonance (ST-FMR) provides a powerful method to quantify SOT. However, conventional analysis methods-such as voltage ratio analysis and DC modulation-often suffer from the limited accuracy due to uncertainties in RF current estimation. In this study, we propose a voltage-based circuit analysis that directly utilizes the measured ST-FMR signals, including parasitic effects, such as RF power loss, modulation factors, and parasitic shunting. Self-consistent checks and measurements on various heterostructures confirm that our approach yields SOT efficiencies consistent with those obtained from conventional methods. Furthermore, substrate-dependent variations are resolved by applying parasitic correction, validating the robustness of our analysis. This work provides an accurate and practical methodology for evaluating SOT efficiency of spin-orbit materials.
- Keywords
- MAGNETIC-PROPERTIES; PERMEABILITY; IMPACT
- URI
- https://pubs.kist.re.kr/handle/201004/153438
- DOI
- 10.1063/5.0293634
- Appears in Collections:
- KIST Article > 2025
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